XU Zhi. Spark Test Device and Its Application in Assessment of Intrinsically Safe Circuit[J]. Journal of Mine Automation, 2011, 37(11): 26-28.
Citation: XU Zhi. Spark Test Device and Its Application in Assessment of Intrinsically Safe Circuit[J]. Journal of Mine Automation, 2011, 37(11): 26-28.

Spark Test Device and Its Application in Assessment of Intrinsically Safe Circuit

  • The paper described structure and principle of spark test device and its application in assessment of intrinsically safe circuit, and pointed out that the device should be adjusted and verified from different aspects while applied to assessment of intrinsically safe circuit, and that the device has limitations such as inapplicability for circuit with testing current greater than 3 A.
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