Development of Short Time AC Current Test Instrument of Industry Based on Double Single-chip Microcomputers

LI Ai-lian; XIE Shao-feng

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Article Navigation > Journal of Mine Automation > 2009 > 35(12): 125-128

LI Ai-lian, XIE Shao-feng. Development of Short Time AC Current Test Instrument of Industry Based on Double Single-chip Microcomputers[J]. Industry and Mine Automation, 2009, 35(12): 125-128.

Citation:

LI Ai-lian, XIE Shao-feng. Development of Short Time AC Current Test Instrument of Industry Based on Double Single-chip Microcomputers[J]. Industry and Mine Automation, 2009, 35(12): 125-128.

LI Ai-lian, XIE Shao-feng. Development of Short Time AC Current Test Instrument of Industry Based on Double Single-chip Microcomputers[J]. Industry and Mine Automation, 2009, 35(12): 125-128.

Citation:

LI Ai-lian, XIE Shao-feng. Development of Short Time AC Current Test Instrument of Industry Based on Double Single-chip Microcomputers[J]. Industry and Mine Automation, 2009, 35(12): 125-128.

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